>From: Journal of Nanomaterials
>Reply-To:
>To: guning@seu.edu.cn
>Subject: Fwd:In Situ Probes for Nanomaterials
>Date:09 Sep 2008 13:27:45 +0200
>
>
>Call for Papers
>
>Materials reduced to the nanoscale can suddenly show very different properties compared to what they exhibit on a macroscale and enable unique applications, which make nanomaterials interesting both for basic scientific research and technological applications. However, a major challenge is to track nanomaterials under many dynamic processes with a probing length scale of a few angstroms to several hundred nanometers. Recently, substantial effort has been devoted to developing new in situ experimental techniques capable of probing atomic-scale information of nanomaterials. In this way, direct 鈥渨atching鈥?can be achieved with both real spatial and time resolution. This is especially effective when applied in combination with complementary techniques such as X-ray diffraction, mass spectrometry, optical and vibrational techniques. In addition, these new techniques allow a critical comparison with results from theoretical calculations, such as ab initio simulations, kinetic Monte Carlo simulations, etc.
>
>This special issue of Journal of Nanomaterials will be partially based on in situ probing techniques of nanomaterials, and also openly call for new contributions in the field of nanotechnology. It intends to cover the entire range of novel technological innovation focusing on synthesis, functionalization, processing, characterization, nanostructured coatings, films, membranes, nanoporous materials, nanocomposites, and other applications.
>
>Papers are solicited in, but not limited to, the following areas:
>
>o In situ studies of nanoparticle growth
>o Real-space probe for metallic nanoparticles
>o In situ characterization of nanoparticulate catalyst
>o Nanoparticle shape dynamics
>o Investigations of phase interfaces
>o Quantum-dots
>o Structure-activity relationships of nanocrystals
>o Observing local surface morphology
>o Atomic force microscopy and scanning tunneling microscopy (AFM/STM)
>o Surface X-ray diffraction, extended X-ray absorption fine structure, X-ray photoelectron spectroscopy, small angle X-ray scattering (SXRD, EXAFS, XPS, SAXS)
>o Vibrational sum frequency generation spectroscopy (VSFG)
>o Scanning transmission electron microscopy (STEM)
>
>Authors should follow the Journal of Nanomaterials manuscript format described at the journal site http://www.hindawi.com/journals/jnm/. Prospective authors should submit an electronic copy of their complete manuscript through the journal Manuscript Tracking System at http://mts.hindawi.com/, according to the following timetable:
>
>Manuscript Due December 1, 2008
>First Round of Reviews March 1, 2009
>Publication Date June 1, 2009
>
>Guest Editors
>
>o Min Xu, Ames Laboratory, United States Department of Energy, and Department of Materials Science and Engineering, Iowa State University, Ames, IA 50011, USA; minxu@iastate.edu
>o Jiangyu Liang, Department of Mechanical Engineering, Worcester Polytechnic Institute, Worcester, MA 02139, USA; jianyul@wpi.edu
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